[IEEE 1991 Symposium on VLSI Technology - Oiso, Japan (May 28-30, 199)] 1991 Symposium on VLSI Technology - Highly Reliable E/sup 2/prom Cell Fabricated with Etox/sup Tm/ Flash Process
Lai, S., Mielke, H., Atwood, G., Chao, C., Johnson, B., Kumar, A., Tam, S., Tang, D.Year:
1991
DOI:
10.1109/vlsit.1991.705989
File:
PDF, 119 KB
1991