[IEEE 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Vancouver, BC, Canada (2011.10.3-2011.10.5)] 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems - On the Reliable Performance of Sequential Adders for Soft Computing
Liang, Jinghang, Han, Jie, Lombardi, FabrizioYear:
2011
Language:
english
DOI:
10.1109/dft.2011.54
File:
PDF, 448 KB
english, 2011