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[IEEE 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Phoenix, AZ, USA (2007.04.15-2007.04.19)] 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Consideration of recovery effects during NBTI measurements for accurate lifetime predictions of state-of-the-art pMOSFETs
Heinrigs, Wolfgang, Reisinger, Hans, Gustin, Wolfgang, Schlunder, ChristianYear:
2007
Language:
english
DOI:
10.1109/relphy.2007.369906
File:
PDF, 372 KB
english, 2007