![](/img/cover-not-exists.png)
[IEEE 2014 IEEE 64th Electronic Components and Technology Conference (ECTC) - Orlando, FL, USA (2014.5.27-2014.5.30)] 2014 IEEE 64th Electronic Components and Technology Conference (ECTC) - An enhanced power integrity analysis flow based on the interdependence between simultaneous switching output noise and static IR drop
Han, Minghui, Amirkhany, Amir, Xiong, WeiYear:
2014
Language:
english
DOI:
10.1109/ectc.2014.6897340
File:
PDF, 3.16 MB
english, 2014