[IEEE 2014 IEEE 64th Electronic Components and Technology...

  • Main
  • [IEEE 2014 IEEE 64th Electronic...

[IEEE 2014 IEEE 64th Electronic Components and Technology Conference (ECTC) - Orlando, FL, USA (2014.5.27-2014.5.30)] 2014 IEEE 64th Electronic Components and Technology Conference (ECTC) - An enhanced power integrity analysis flow based on the interdependence between simultaneous switching output noise and static IR drop

Han, Minghui, Amirkhany, Amir, Xiong, Wei
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2014
Language:
english
DOI:
10.1109/ectc.2014.6897340
File:
PDF, 3.16 MB
english, 2014
Conversion to is in progress
Conversion to is failed