[IEEE 2008 23rd IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFTVS) - Cambridge, MA, USA (2008.10.1-2008.10.3)] 2008 IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems - Design and Evaluation of a Timestamp-Based Concurrent Error Detection Method (CED) in a Modern Microprocessor Controller
Maniatakos, Michail, Karimi, Naghmeh, Makris, Yiorgos, Jas, Abhijit, Tirumurti, ChandraYear:
2008
Language:
english
DOI:
10.1109/dft.2008.59
File:
PDF, 225 KB
english, 2008