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[IEEE SICE Annual Conference 2007 - Takamatsu, Japan (2007.09.17-2007.09.20)] SICE Annual Conference 2007 - Nano-level 3-D measurement system using combination of 3-wavelength laser lights
Masashi Nomura,, Junichiro Hayashi,, Shigeaki Morimoto,, Seiji Hata,, Ichiro Ishimaru,Year:
2007
Language:
english
DOI:
10.1109/sice.2007.4421084
File:
PDF, 1.32 MB
english, 2007