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[IEEE 2008 International Conference on High Voltage Engineering and Application (ICHVE) - Chongqing, China (2008.11.9-2008.11.12)] 2008 International Conference on High Voltage Engineering and Application - Insulation Integrity of Three Phase Common Enclosure Gas Insulated Busduct with Particle Contamination under Image Charges
Goud, R. Rajasekhar, Kumar, G. V. Nagesh, Amarnath, J., Chowdary, D. DeepakYear:
2008
Language:
english
DOI:
10.1109/ichve.2008.4773981
File:
PDF, 676 KB
english, 2008