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[IEEE 30th Annual Proceedings Reliability Physics 1992 - San Diego, CA, USA (1992.03.31-1992.04.2)] 30th Annual Proceedings Reliability Physics 1992 - Low frequency 1/f noise and current gain degradation in BiCMOS n-p-n transistors
Dreyer, M.L., Durec, J.Year:
1992
DOI:
10.1109/relphy.1992.187630
File:
PDF, 442 KB
1992