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[IEEE 2012 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2012.12.10-2012.12.13)] 2012 International Electron Devices Meeting - RRAM SET speed-disturb dilemma and rapid statistical prediction methodology
Luo, Wun-Cheng, Liu, Jen-Chieh, Feng, Hsien-Tsung, Lin, Yen-Chuan, Huang, Jiun-Jia, Lin, Kuan-Liang, Hou, Tuo-HungYear:
2012
Language:
english
DOI:
10.1109/IEDM.2012.6479012
File:
PDF, 1.55 MB
english, 2012