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[IEEE 2010 IEEE International Symposium on Electromagnetic Compatibility - EMC 2010 - Fort Lauderdale, FL (2010.07.25-2010.07.30)] 2010 IEEE International Symposium on Electromagnetic Compatibility - Modeling of the immunity of ICs to EFTs
Ji Zhang,, Jayong Koo,, Beetner, Daryl G, Moseley, Richard, Herrin, Scott, Pommerenke, DavidYear:
2010
Language:
english
DOI:
10.1109/isemc.2010.5711323
File:
PDF, 1.26 MB
english, 2010