[IEEE 2011 IEEE International Electron Devices Meeting (IEDM) - Washington, DC, USA (2011.12.5-2011.12.7)] 2011 International Electron Devices Meeting - Impact of TDDB in MG/HK devices on circuit functionality in advanced CMOS technologies
Kerber, A., Lipp, D., Trentzsch, M., Linder, B.P., Cartier, E.Year:
2011
Language:
english
DOI:
10.1109/iedm.2011.6131576
File:
PDF, 467 KB
english, 2011