Robust Intermediate Read-Out for Deep Submicron Technology...

IEEE Sensors Journal 2008 Vol. 8; Iss. 3

Robust Intermediate Read-Out for Deep Submicron Technology CMOS Image Sensors

Shoushun, Chen, Boussaid, Farid, Bermak, Amine
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Volume:
8
Year:
2008
Language:
english
Journal:
IEEE Sensors Journal
DOI:
10.1109/JSEN.2007.912783
File:
PDF, 3.51 MB
english, 2008
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