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[IEEE 2002 International Test Conference - Baltimore, MD, USA (7-10 Oct. 2002)] Proceedings. International Test Conference - Static analysis of SEU effects on software applications
Benso, A., Di Carlo, S., Di Natale, G., Prinetto, P.Year:
2002
Language:
english
DOI:
10.1109/test.2002.1041800
File:
PDF, 495 KB
english, 2002