Total Dose Evaluation of Deep Submicron CMOS Imaging...

IEEE Transactions on Nuclear Science 2008 / 12 Vol. 55; Iss. 6

Total Dose Evaluation of Deep Submicron CMOS Imaging Technology Through Elementary Device and Pixel Array Behavior Analysis

Goiffon, V., Magnan, P., Saint-pe, O., Bernard, F., Rolland, G.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
55
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2008.2005294
Date:
December, 2008
File:
PDF, 814 KB
english, 2008
Conversion to is in progress
Conversion to is failed