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Total Dose Evaluation of Deep Submicron CMOS Imaging Technology Through Elementary Device and Pixel Array Behavior Analysis
Goiffon, V., Magnan, P., Saint-pe, O., Bernard, F., Rolland, G.Volume:
55
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2008.2005294
Date:
December, 2008
File:
PDF, 814 KB
english, 2008