[IEEE 2013 IEEE MTT-S International Microwave and RF Conference - New Delhi, India (2013.12.14-2013.12.16)] IEEE MTT-S International Microwave and RF Conference - A least-squares approach to the calibration of multiport reflectometers
Staszek, Kamil, Kaminski, Piotr, Rydosz, Artur, Gruszczynski, Slawomir, Wincza, KrzysztofYear:
2013
Language:
english
DOI:
10.1109/imarc.2013.6777712
File:
PDF, 208 KB
english, 2013