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[IEEE 2008 IEEE International Conference on Industrial Technology - (ICIT) - Chengdu, China (2008.04.21-2008.04.24)] 2008 IEEE International Conference on Industrial Technology - Parameter monitoring and control in industrial sewing machines - an integrated approach
Carvalho, Helder, Rocha, Ana, Monteiro, Joao L., Silva, Luis F.Year:
2008
Language:
english
DOI:
10.1109/icit.2008.4608388
File:
PDF, 1.40 MB
english, 2008