[IEEE 2008 International Conference on Advanced Optoelectronics and Lasers (CAOL) - Alushta, Crimea, Ukraine (2008.09.29-2008.10.4)] 2008 4th International Conference on Advanced Optoelectronics and Lasers - Structure and nonlinear refraction of nanocrystal SiC thin films
Brodyn, M.S., Borshch, A.A., Volkov, V.I., Liahoveckyi, V.R., Rudenko, V.I., Semenov, A.V., Puzikov, V.M.Year:
2008
Language:
english
DOI:
10.1109/caol.2008.4671865
File:
PDF, 39 KB
english, 2008