[IEEE 26th Annual Proceedings Reliability Physics Symposium...

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[IEEE 26th Annual Proceedings Reliability Physics Symposium 1988 - Monterey, CA, USA (12-14 April 1988)] 26th Annual Proceedings Reliability Physics Symposium 1988 - Internal chip ESD phenomena beyond the protection circuit

Duvvury, C., Rountree, R.N., Adams, O.
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Year:
1988
Language:
english
DOI:
10.1109/relphy.1988.23419
File:
PDF, 711 KB
english, 1988
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