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[IEEE 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - Tallinn, Estonia (2012.04.18-2012.04.20)] 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) - OBIST strategy versus parametric test - Efficiency in covering catastrophic faults in active analog filters
Arbet, Daniel, Gyepes, Gabor, Brenkus, Juraj, Stopjakova, VieraYear:
2012
Language:
english
DOI:
10.1109/ddecs.2012.6219053
File:
PDF, 626 KB
english, 2012