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[IEEE 2012 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2012.12.10-2012.12.13)] 2012 International Electron Devices Meeting - On the degradation of field-plate assisted RESURF power devices
Boksteen, B. K., Dhar, S., Ferrara, A., Heringa, A., Hueting, R. J. E., Koops, G. E. J., Salm, C., Schmitz, J.Year:
2012
Language:
english
DOI:
10.1109/IEDM.2012.6479036
File:
PDF, 2.83 MB
english, 2012