[IEEE Third European Conference on Radiation and its Effects on Components and Systems - Arcachon, France (18-22 Sept. 1995)] Proceedings of the Third European Conference on Radiation and its Effects on Components and Systems - Model of single event upsets induced by space protons in electronic devices
Doucin, B., Carriere, T., Poivey, C., Garnier, P., Beaucour, J., Patin, Y.Year:
1996
Language:
english
DOI:
10.1109/radecs.1995.509810
File:
PDF, 529 KB
english, 1996