Retention Property Analysis of Epitaxially Grown YMnO 3 /Y 2 O 3 /Si Capacitor
Ito, Daisuke, Fujimura, Norifumi, Kakuno, Kosuke, Ito, TaichiroVolume:
271
Language:
english
Journal:
Ferroelectrics
DOI:
10.1080/713716221
Date:
January, 2002
File:
PDF, 335 KB
english, 2002