Images of Impurity Line Emission in the Extreme Ultraviolet Region From the Large Helical Device With an Edge Stochastic Magnetic Field Layer
Morita, Shigeru, Wang, Erhui, Dong, Chunfeng, Oishi, Tetsutarou, Goto, Motoshi, Huang, XianliVolume:
42
Language:
english
Journal:
IEEE Transactions on Plasma Science
DOI:
10.1109/TPS.2014.2342231
Date:
October, 2014
File:
PDF, 469 KB
english, 2014