[IEEE 2005 13th International Conference on Advanced Thermal Processing of Semiconductors - Santa Barbara, CA, USA (04-07 Oct. 2005)] 2005 13th International Conference on Advanced Thermal Processing of Semiconductors - Infrared Emittance Measurements at NIST
Hanssen, L.M., Tsai, B.K., Mekhontsev, S.N.Year:
2005
Language:
english
DOI:
10.1109/rtp.2005.1613711
File:
PDF, 1.83 MB
english, 2005