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[IEEE 2008 8th IEEE Conference on Nanotechnology (NANO) - Arlington, Texas, USA (2008.08.18-2008.08.21)] 2008 8th IEEE Conference on Nanotechnology - Investigation of Strain Effects on the Band-Structure of Si Nanowires using TB and DFT Methods
Shiri, Daryoush, Kong, Yifan, Buin, A., Anantram, M. P.Year:
2008
Language:
english
DOI:
10.1109/nano.2008.107
File:
PDF, 434 KB
english, 2008