Quasistatic X-Ray Speckle Metrology of Microscopic Magnetic...

Quasistatic X-Ray Speckle Metrology of Microscopic Magnetic Return-Point Memory

Pierce, Michael S., Moore, Rob G., Sorensen, Larry B., Kevan, Stephen D., Hellwig, Olav, Fullerton, Eric E., Kortright, Jeffrey B.
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Volume:
90
Language:
english
Journal:
Physical Review Letters
DOI:
10.1103/PhysRevLett.90.175502
Date:
April, 2003
File:
PDF, 419 KB
english, 2003
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