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[IEEE Comput. Soc. Press International Test Conference 1988 Proceeding@m_New Frontiers in Testing - Washington, DC, USA (12-14 Sept. 1988)] International Test Conference 1988 Proceeding@m_New Frontiers in Testing - Trouble-shooting: a key to process improvement
Yau, C.W., Chang, S.-L., Jordan, B.F., Schwermann, J.J., Wellman, J.A.Year:
1988
Language:
english
DOI:
10.1109/test.1988.207866
File:
PDF, 780 KB
english, 1988