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[IEEE 26th IEEE VLSI Test Symposium (vts 2008) - San Diego, CA, USA (2008.04.27-2008.05.1)] 26th IEEE VLSI Test Symposium (vts 2008) - Test-Pattern Ordering for Wafer-Level Test-During-Burn-In
Bahukudumbi, Sudarshan, Chakrabarty, KrishnenduYear:
2008
Language:
english
DOI:
10.1109/vts.2008.28
File:
PDF, 981 KB
english, 2008