[IEEE APCCAS 2010-2010 IEEE Asia Pacific Conference on Circuits and Systems - Kuala Lumpur, Malaysia (2010.12.6-2010.12.9)] 2010 IEEE Asia Pacific Conference on Circuits and Systems - Combining unspecified test data bit filling methods and run length based codes to estimate compression, power and area overhead
Mehta, Usha Sandeep, Dasgupta, Kankar S., Devashrayee, Niranjan M.Year:
2010
Language:
english
DOI:
10.1109/APCCAS.2010.5774808
File:
PDF, 696 KB
english, 2010