High-energy ion irradiation effects on thin oxide p-channel MOSFETs
Candelori, A., Contarato, D., Bacchetta, N., Bisello, D., Hall, G., Noah, E., Raymond, A., Wyss, J.Volume:
49
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2002.1039668
Date:
June, 2002
File:
PDF, 323 KB
english, 2002