[IEEE 2007 IEEE International Reliability Physics Symposium...

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[IEEE 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Phoenix, AZ, USA (2007.04.15-2007.04.19)] 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Theoretical Analysis of Vacancy Transport Combined with Electromigration and Stress Induced Voiding

Nemoto, Takenao, Yokobori, A. Toshimitsu, Murakawa, Tsutomu
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Year:
2007
Language:
english
DOI:
10.1109/relphy.2007.369987
File:
PDF, 606 KB
english, 2007
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