![](/img/cover-not-exists.png)
[IEEE 2010 15th IEEE European Test Symposium (ETS) - Praha, Czech Republic (2010.05.24-2010.05.28)] 2010 15th IEEE European Test Symposium - Defect-aware nanocrossbar logic mapping using Bipartite Subgraph Isomorphism & canonization
Goren, Sezer, Ugurdag, H. Fatih, Palaz, OkanYear:
2010
Language:
english
DOI:
10.1109/etsym.2010.5512747
File:
PDF, 243 KB
english, 2010