[IEEE 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2010) - Singapore, Singapore (2010.07.5-2010.07.9)] 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - Advanced failure analysis of photon emission on FEOL failing of 45nm technology node
Chen changqing,, Ang Ghim Boon,, Ng Hui Peng,, Yip Kim Hong,, Wang Qingxiao,Year:
2010
Language:
english
DOI:
10.1109/ipfa.2010.5531981
File:
PDF, 1.07 MB
english, 2010