[IEEE 2008 IEEE International Symposium on Electromagnetic Compatibility - EMC 2008 - Detroit, MI (2008.08.18-2008.08.22)] 2008 IEEE International Symposium on Electromagnetic Compatibility - Link path design on a block-by-block basis
de Paulis, Francesco, Fan, Jun, Diepenbrock, Jay, Archambeault, Bruce, Connor, Samuel, Orlandi, AntonioYear:
2008
Language:
english
DOI:
10.1109/isemc.2008.4652140
File:
PDF, 525 KB
english, 2008