[IEEE Comput. Soc. Press Fourth Asian Test Symposium - Bangalore, India (23-24 Nov. 1995)] Proceedings of the Fourth Asian Test Symposium - Flip-flop sharing in standard scan path to enhance delay fault testing of sequential circuits
Hurst, J.P., Kanopoulos, N.Year:
1995
Language:
english
DOI:
10.1109/ats.1995.485359
File:
PDF, 624 KB
english, 1995