IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
2012 / 10 Vol. 31; Iss. 10
Analytical Eye-Diagram Determination for the Efficient and Accurate Signal Integrity Verification of Single Interconnect Lines
Kim, Dongchul, Kim, Hyewon, Eo, YungseonVolume:
31
Language:
english
Journal:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
DOI:
10.1109/TCAD.2012.2196277
Date:
October, 2012
File:
PDF, 5.47 MB
english, 2012