![](/img/cover-not-exists.png)
Hole Injection in Germanium-Quantitative Studies and Filamentary Transistors*
Shockley, W., Pearson, G. L., Haynes, J. R.Volume:
28
Language:
english
Journal:
Bell System Technical Journal
DOI:
10.1002/j.1538-7305.1949.tb03641.x
Date:
July, 1949
File:
PDF, 7.45 MB
english, 1949