Fundamental aspects of Am and Cm In Zirconia-based...

Journal of Nuclear Science and Technology 2002 / 11 Vol. 39; Iss. sup3

Fundamental aspects of Am and Cm In Zirconia-based materials: investigations using X-ray diffraction and Raman spectroscopy

Raison, P. E., Haire, R. G., Assefa, Z.
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Volume:
39
Language:
english
Journal:
Journal of Nuclear Science and Technology
DOI:
10.1080/00223131.2002.10875569
Date:
November, 2002
File:
PDF, 2.29 MB
english, 2002
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