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[IEEE 2010 IEEE Instrumentation & Measurement Technology Conference Proceedings - Austin, TX, USA (2010.05.3-2010.05.6)] 2010 IEEE Instrumentation & Measurement Technology Conference Proceedings - Method for measuring the twist angle of an optically compensation bend by using the heterodyne interferometry
Wang, Shinn-Fwu, Lai, Wesley, Chiu, Jyh-Shyan, Yeh, Rih-Huei, Tseng, Heng-Cheng, Chen, Wei-ChouYear:
2010
Language:
english
DOI:
10.1109/IMTC.2010.5488151
File:
PDF, 693 KB
english, 2010