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[IEEE 2014 IEEE International Reliability Physics Symposium (IRPS) - Waikoloa, HI, USA (2014.6.1-2014.6.5)] 2014 IEEE International Reliability Physics Symposium - Preventing single event latchup with deep P-well on P-substrate
Uemura, T., Kato, T., Tanabe, R., Iwata, H., Matsuyama, H., Hashimoto, M., Takahisa, K., Fukuda, M., Hatanaka, K.Year:
2014
Language:
english
DOI:
10.1109/irps.2014.6861175
File:
PDF, 201 KB
english, 2014