Corner Effect and Local Volume Inversion in SiNW FETs

IEEE Transactions on Nanotechnology 2011 / 07 Vol. 10; Iss. 4

Corner Effect and Local Volume Inversion in SiNW FETs

De Michielis, L., Moselund, K. E., Selmi, L., Ionescu, A. M.
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Volume:
10
Language:
english
Journal:
IEEE Transactions on Nanotechnology
DOI:
10.1109/TNANO.2010.2080284
Date:
July, 2011
File:
PDF, 926 KB
english, 2011
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