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High-Performance 90-nm Dual-Gate nMOSFETs With Field-Plate Technology
Fu, Jeffrey S., Chiu, Hsien-Chin, Ke, Po-Yu, Chen, Ting-Huei, Feng, Wu-ShiungVolume:
32
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/LED.2010.2102738
Date:
March, 2011
File:
PDF, 752 KB
english, 2011