Soft X-ray characterization of perpendicular recording...

IEEE Transactions on Magnetics 2002 / 07 Vol. 38; Iss. 4

Soft X-ray characterization of perpendicular recording media

Fullerton, E.E., Hellwig, O., Ikeda, Y., Lengsfield, B., Takano, K., Kortright, J.B.
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Volume:
38
Language:
english
Journal:
IEEE Transactions on Magnetics
DOI:
10.1109/tmag.2002.1017758
Date:
July, 2002
File:
PDF, 273 KB
english, 2002
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