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Understanding Linear-Mode Robustness in Low-Voltage Trench Power MOSFETs
Alatise, O.M., Kennedy, I., Petkos, G., Khan, K., Koh, A., Rutter, P.Volume:
10
Language:
english
Journal:
IEEE Transactions on Device and Materials Reliability
DOI:
10.1109/tdmr.2009.2036001
Date:
March, 2010
File:
PDF, 469 KB
english, 2010