[IEEE IEEE Radio Frequency Integrated Circuits (RFIC) Symposium, 2006 - San Francisco, CA (JUNE 11-13, 2006)] IEEE Radio Frequency Integrated Circuits (RFIC) Symposium, 2006 - Reverse Noise Measurement and Use in Device Characterization
Randa, J., McKay, T., Sweeney, S.L., Walker, D.K., Wagner, L., Greenberg, D.R., Tao, J., Rezvani, G.A.Year:
2006
Language:
english
DOI:
10.1109/rfic.2006.1651152
File:
PDF, 219 KB
english, 2006