Influence of die attachment on MOS transistor matching

IEEE Transactions on Semiconductor Manufacturing 1997 / 5 Vol. 10; Iss. 2

Influence of die attachment on MOS transistor matching

Bastos, J., Steyaert, M.S.J., Pergoot, A., Sansen, W.M.
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Volume:
10
Language:
english
Journal:
IEEE Transactions on Semiconductor Manufacturing
DOI:
10.1109/66.572070
Date:
May, 1997
File:
PDF, 259 KB
english, 1997
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