[IEEE International Reliability Physics Symposium - Dallas, TX, USA (30 March-4 April 2003)] 2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual. - A device level negative feedback in the emitter line of SCR-structures as a method to realize latch-up free ESD protection
Concannon, A., Vashchenko, V.A., ter Beek, M., Hopper, P.Year:
2003
Language:
english
DOI:
10.1109/relphy.2003.1197728
File:
PDF, 466 KB
english, 2003