[IEEE 2004 IEEE International SOI Conference - Charleston,...

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[IEEE 2004 IEEE International SOI Conference - Charleston, SC, USA (4-7 Oct. 2004)] 2004 IEEE International SOI Conference (IEEE Cat. No.04CH37573) - DC and RF characterization of fully depleted strained SOI MOSFETs

Chen, C.L., Langdo, T.A., Chen, C.K., Fiorenza, J.G., Wyatt, P.W., Currie, M.T., Leitz, C.W., Braithwaite, G., Fritze, M., Lambert, R., Yost, D.-R., Cheng, Z., Lochtefeld, A., Keast, C.K.
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Year:
2004
Language:
english
DOI:
10.1109/soi.2004.1391567
File:
PDF, 192 KB
english, 2004
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