[IEEE 22nd IEEE VLSI Test Symposium, 2004. - Napa Valley,...

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[IEEE 22nd IEEE VLSI Test Symposium, 2004. - Napa Valley, CA, USA (25-29 April 2004)] 22nd IEEE VLSI Test Symposium, 2004. Proceedings. - Logic BIST using constrained scan cells

Liyang Lai,, Rinderknecht, T., Wu-Tung Cheng,, Patel, J.H.
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Year:
2004
Language:
english
DOI:
10.1109/vtest.2004.1299244
File:
PDF, 1.47 MB
english, 2004
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