Conductivity and Charge Trapping After Electrical Stress in...

IEEE Transactions on Nanotechnology 2011 / 03 Vol. 10; Iss. 2

Conductivity and Charge Trapping After Electrical Stress in Amorphous and Polycrystalline $\hbox{Al}_{2}\hbox{O}_{3}\hbox{-Based}$ Devices Studied With AFM-Related Techniques

Lanza, Mario, Porti, Marc, Nafría, Montserrat, Aymerich, Xavier, Benstetter, Günther, Lodermeier, Edgar, Ranzinger, Heiko, Jaschke, Gert, Teichert, Steffen, Wilde, Lutz, Michalowski, Pawel Piotr
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Volume:
10
Language:
english
Journal:
IEEE Transactions on Nanotechnology
DOI:
10.1109/tnano.2010.2041935
Date:
March, 2011
File:
PDF, 1.08 MB
english, 2011
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